Tecnai TF 20 X-TWIN (200 kV) is a high resolution transmission electron microscope equipped with field emission gun (FEG), providing beam current of 0.5 A in the 1 nm spot (point resolution ≤ 0.22, information limit  ≤ 0.14 nm). The microscope has an integrated energy dispersive spectrometer (EDAX) allowing for chemical analysis of micro-/nano- regions of a sample. Additionally, it is possible to perform STEM investigations using HAADF imaging detector.

WORKING PARAMETERS

Type of electron gun

FEG

Acceleration voltage

200 kV

Magnification range

1025 - 900 k

CCD camera

Eagle 2k HR

Detectors

EDAX RTEM 0.3 sr, HAADF

STEM mode

YES

Holders

Double Tilt Low Background, Single Tilt

Software

TEM Imaging & Analysis, Low Dose,   K-space control, Smart tilt, Compucentricity, TrueImage Pro

Contact person

dr inż. Marta Gajewska

 

    
Transmission electron microscope
    
Transmission electron microscope
    
Transmission electron microscope